Title: Crystal structure and magnetic properties of UO2/permalloy thin films
Authors: TERESHINA EvgeniaDANIS S.SPRINGELL R.BAO ZHAOHUIHAVELA L.CACIUFFO Roberto
Citation: THIN SOLID FILMS vol. 591 no. part B p. 271-275
Publisher: ELSEVIER SCIENCE SA
Publication Year: 2015
JRC N°: JRC92687
ISSN: 0040-6090
URI: http://ictf16.com/
http://www.sciencedirect.com/science/article/pii/S0040609015005489
http://publications.jrc.ec.europa.eu/repository/handle/JRC92687
DOI: 10.1016/j.tsf.2015.05.014
Type: Articles in periodicals and books
Abstract: The exchange bias effect was studied on antiferromagnetic-ferromagnetic UO2/permalloy (Ni80Fe20) thin films. Films with a fixed thickness of UO2 layer and variable thickness of the covering Ni80Fe20 layer have been grown by reactive sputter deposition. The X-ray diffraction study showed epitaxial growth of the UO2 layer on (100) CaF2 substrates and a polycrystalline permalloy layer on top of it. The samples exhibited perpendicular exchange bias with the maximum magnitude of 22 mT found in UO2/Ni80Fe20 with the thinnest permalloy of 177 Å.
JRC Directorate:Nuclear Safety and Security

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