Title: Analysis of crystalline silicon PV modules after 30 years of outdoor exposure
Publisher: WIP
Publication Year: 2015
JRC N°: JRC94897
ISBN: 3-936338-39-6
URI: https://www.eupvsec-proceedings.com
DOI: 10.4229/EUPVSEC20152015-5DO.9.3
Type: Articles in periodicals and books
Abstract: In order to assure the generation of photovoltaic based electricity be economically cost-effective, it is crucial to ensure the long-term reliability and lifetime of all parts of the PV system and in particular of the photovoltaic modules. Standardized tests, such as IEC 61215 and IEC 61646, ensure the confidence in PV technology and have allowed a steady growth of the PV market. However, these tests were designed for the detection of modules design, manufacturing and material flaws which can lead to an early failure, but they do not address the issues related to degradation over long periods of time. For this purpose, it is important to analyse the degradation mechanisms of PV modules that have been field exposed for long periods of time, in order to detect failure modes that occur in the field and develop accelerated stress test that can replicate them. This work presents the analysis of crystalline silicon PV modules that were exposed outdoor for more than 30 years without cleaning. A set of 28 silicon wafer based modules with different types of front glass and cell layout were analysed by electrical characterization, visual inspection, electroluminescence and thermal imaging.
JRC Directorate:Energy, Transport and Climate

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