X-ray diffraction on crystalline powders offers a convenient method for determining the mean size of single crystal nanoparticles or nanograins in nanocrystalline bulk materials. The first to investigate the effect of limited particle size, and hence limited number of
lattice planes contributing to diffraction, on the width of x-ray diffraction peaks was Paul Scherrer who published his results in 19181 in a paper that included what became known as Scherrer’s formula (or Scherrer’s equation). This still represents the most useful x-ray
method for determining average particle or grain size Dhkl perpendicular to the analyzed lattice planes with the Miller indices (hkl).
GIBSON Peter;
HOLZWARTH Uwe;
2011-09-19
NATURE PUBLISHING GROUP
JRC65586
1748-3387,
https://publications.jrc.ec.europa.eu/repository/handle/JRC65586,
10.1038/nnano.2011.145,
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